Effects of Additional Noise of an Electron-Multiplying CCD on Astronomical High-Resolution Imaging

Zhang Xiangbo; Jin Zhenyu

Astronomical Research and Technology > 2013 > 10(1): 62-68.

Zhang Xiangbo, Jin Zhenyu. Effects of Additional Noise of an Electron-Multiplying CCD on Astronomical High-Resolution Imaging[J]. Astronomical Research and Technology, 2013, 10(1): 62-68.

Citation:

Zhang Xiangbo, Jin Zhenyu. Effects of Additional Noise of an Electron-Multiplying CCD on Astronomical High-Resolution Imaging[J]. Astronomical Research and Technology, 2013, 10(1): 62-68.

Citation:

Zhang Xiangbo, Jin Zhenyu. Effects of Additional Noise of an Electron-Multiplying CCD on Astronomical High-Resolution Imaging[J]. Astronomical Research and Technology, 2013, 10(1): 62-68.

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Effects of Additional Noise of an Electron-Multiplying CCD on Astronomical High-Resolution Imaging

Yunnan Observatory, Chinese Academy of Sciences, Kunming 650011, China

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Received Date: March 04, 2012
Revised Date: May 16, 2012
Published Date: January 14, 2013

Graphical Abstract

Abstract

Abstract

Based on the discussion of generating mechanisms and characteristics of additional noise of an Electron-Multiplying CCD, we use simulations to analyze the effect of the noises on the Astronomical High-Resolution Statistical Reconstruction Method (Speckle Interferometry). We compare our analysis to experimental results. We show that the bias introduced by the additional noise reduces the Signal-to-Noise Ratio of Speckle Interferometry when the object is faint. The bias seriously affects the results of reconstruction and must be corrected. It can be clearly seen from the result of reconstruction of real data that our noise-bias correction can effectively remove the effects an of EMCCD additional noise on the reconstruction of the autocorrelation or power spectrum of an object image in the Speckle Interferometry.

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References (13)

References

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