Cai Hengjin, Xu Chufu, Chen Peiren. Studies of Dynamic Processes of Sporadic-E Layers with Digital Ionosonde[J]. Publications of the Yunnan Observatory, 1990, (S1): 164-170.
Citation:
Cai Hengjin, Xu Chufu, Chen Peiren. Studies of Dynamic Processes of Sporadic-E Layers with Digital Ionosonde[J]. Publications of the Yunnan Observatory, 1990, (S1): 164-170.
Cai Hengjin, Xu Chufu, Chen Peiren. Studies of Dynamic Processes of Sporadic-E Layers with Digital Ionosonde[J]. Publications of the Yunnan Observatory, 1990, (S1): 164-170.
Citation:
Cai Hengjin, Xu Chufu, Chen Peiren. Studies of Dynamic Processes of Sporadic-E Layers with Digital Ionosonde[J]. Publications of the Yunnan Observatory, 1990, (S1): 164-170.
Using digital ionosonde in Beijing,we have observed the wave-like and rapid-changing variances of the vertical Doppler shift when intense Sporadic-E occurs. The relationship between h'Es and foEs is also studied.It is supposed that the descent of Es may cause shock-like structure which may increase foEs. The digital ionosonde is a useful means to study the dynamic processes of sporadic-E layers.